Comparative study of the electronic structure of XRu2Si2: probing the Anderson lattice

Citation
Jd. Denlinger et al., Comparative study of the electronic structure of XRu2Si2: probing the Anderson lattice, J ELEC SPEC, 117, 2001, pp. 347-369
Citations number
54
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
117
Year of publication
2001
Pages
347 - 369
Database
ISI
SICI code
0368-2048(200106)117:<347:CSOTES>2.0.ZU;2-U
Abstract
dThe k-resolved single particle excitations, as determined by angle-resolve d photoemission spectroscopy (ARPES), are compared and contrasted for, LaRu 2Si2, CeRu2Si2, ThRu2Si2, and URu2Si2, isostructural layered compounds with differing nominal f-occupations of f(0), f(1), f(0), and f(2), respectivel y. ARPES measurements include 4d and Sd-edge resonant photoemission to dist inguish S-character and Fermi-energy intensity mapping of Fermi surface con tours. Comparison to RLAPW band structure calculations shows very good agre ement of the d-band structure away from E-j. Discrepancies in the near E-j region highlight k-dependent effects of f-correlation and f-d hybridization . Approximately equal dimensions of Fermi contours for X = (La, Ce) suggest the exclusion of 4f electrons from the CeRu2Si2 Fermi surface at temperatu res far above the Kondo temperature. High-resolution spectra for X= (Ce, U) allow comparison of f-d mixing to predictions of the Anderson lattice mode l. Published by Elsevier Science B.V.