X-ray photoelectron spectroscopy of electrodeposited cadmium mercury telluride thin films and their native surface oxides

Authors
Ramiro, J Galan, L Camarero, EG Montero, I Laaziz, Y
Citation
J. Ramiro et al., X-ray photoelectron spectroscopy of electrodeposited cadmium mercury telluride thin films and their native surface oxides, J MATER RES, 16(7), 2001, pp. 1942-1952
Citations number
56
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS RESEARCH
ISSN journal
08842914 → ACNP
Volume
16
Issue
7
Year of publication
2001
Pages
1942 - 1952
Database
ISI
SICI code
0884-2914(200107)16:7<1942:XPSOEC>2.0.ZU;2-H
Abstract
Electrodeposited thin films of CdTe and CdXHg1-xTe with 1 - x = 0 and appro ximately 0.1 were characterized by x-ray photoelectron spectroscopy. The co mposition of the bulk and the thickness and composition of the native surfa ce oxide before and after Ar+ ion sputtering were determined, A surface oxi de layer 20-Angstrom thick constituted mainly of alloyed TeO2 and CdO was f ound over a nearly stochiometric bulk. Chemical diffusion of Hg, Cd, and Te to the surface was observed. Hg appears to inhibit oxidation of the tellur ide, mainly of Te. Ar sputtering removed undesirable oxides and impurities off the films.