Deformational twinning in CdTe crystals grown by the Bridgman method

The results of the crystal growth of cadmium telluride (CdTe) crystals by t he Bridgman method are reported in the present work. A stoichiometric ratio of cadmium and tellurium in the melt as well as cadmium- and tellurium-ric h melts are used in the different cryst;ll growth experiments by the Bridgm an method. The obtained large (phi 54 mm) crystals are plastically deformed . They were examined by X-ray diffraction methods. The conclusion that some of the twins in the melt grown CdTe crystals at high temperatures are due to the thermal stress is made according to the experimental findings. Some results concerning the influence of the {111}-{111} twin boundaries on the resistivity as well as the counting of low energy gamma rays characteristic s are presented here also. The worsened resistivity and parameters in count ing of Am-241 source gamma -rays are explained by the presence of structura l defects in the solid state gamma -ray counters. (C) 2001 Elsevier Science B.V. All rights reserved.