EVIDENCE FOR PHOTOELECTRON BACKSCATTERING BY INTERSTITIAL CHARGE-DENSITIES

Authors
WENDE H SRIVASTAVA P CHAUVISTRE R MAY F BABERSCHKE K ARVANITIS D REHR JJ
Citation
H. Wende et al., EVIDENCE FOR PHOTOELECTRON BACKSCATTERING BY INTERSTITIAL CHARGE-DENSITIES, Journal of physics. Condensed matter, 9(31), 1997, pp. 427-433
Citations number
13
Categorie Soggetti
Physics, Condensed Matter
Journal title
Journal of physics. Condensed matter → ACNP
ISSN journal
09538984
Volume
9
Issue
31
Year of publication
1997
Pages
427 - 433
Database
ISI
SICI code
0953-8984(1997)9:31<427:EFPBBI>2.0.ZU;2-0
Abstract
The presence of oscillatory structures in the atomic x-ray absorption background is reported for the first time for surface-EXAFS of c(2 x 2 )N/Cu(100) and (2 x 3)N/Cu(110). Systematic analysis of this feature ( AXAF'S) and comparison to theory yields new information on the electro nic structure of the adsorbate-substrate surface bond. Also, angle and temperature dependent analysis of the AXAFS peak provides qualitative information about interstitial charge density distribution.