THE CRYSTALLIZATION BEHAVIOR OF PB(ZRTI)O-3 SOL-GEL FILMS ON PLATINUM-ELECTRODES

An understanding of the growth mechanisms of ferroelectric lead zircon ate titanate films is fundamental to the preparation of optimal device s. This work presents the results of X ray diffraction analysis and cr oss-section transmission electron microscopy obtained on Pb(Zr0.52Ti0. 48)O-3, and correlates them with electrical properties and preparation conditions. The particular preparation method chosen has demonstrated that the phase which tends to form below 550 degrees C has the pyroch lore structure. Intermediate crystallisation of the film can result in discontinuities if the correct temperatures are not used and spurious phases form at the free surface. (C) 1997 Elsevier Science S.A.