Two methods were examined for the formation of poly-Si films. One is flux m
ethod and the other is Cat-CVD method. Flux method was used for forming pol
y-Si seed films on glass substrates covered with rear electrode. Poly-Si fi
lms of a few mum grain size and of mainly (111) crystalline orientation wer
e obtained at less than 600 degreesC. To make the seed films function as BS
F layer for solar cell, boron doping was applied and carrier concentration
of 2 x 10(19)/cm(3) was obtained which is suitable for highly efficient sol
ar cells. Cat (catalytic)-CVD method was examined for forming poly-Si photo
-active layers on the seed films. The films showed deposition gas pressure-
dependent crystalline orientations and there was no amorphous incubation la
yer in (111) oriented films by Cat-CVD method when deposited on(111) orient
ed seed films prepared by Flux method. The electrical properties of the fil
m are insufficient at present, may be due to high defect density and the fi
lm structure which allows impurity contaminations of oxygen and carbon afte
r film deposition. Although the film quality needs to be improved, poly-Si
films whose crystal fraction is more than 85% were obtained at deposition r
ate of up to around 40 Angstrom /s. This result indicates high potential of
Cat-CVD method for high throughput photo-active formation process necessar
y for low production cost thin him silicon solar cells. (C) 2001 Elsevier S
cience B.V. All rights reserved.