R. Scheer et al., Incorporation of the doping elements Sn, N, and P in CuInS2 thin films prepared by co-evaporation, THIN SOL FI, 392(1), 2001, pp. 1-10
The incorporation of the doping elements N, P, and Sn as well as the impact
of these elements on electrical properties of co-evaporated CuInS2 thin fi
lms is studied. We show that by using a radical source for nitrogen, this e
lement can be incorporated. Electrical activity of the nitrogen acceptor, h
owever, could not be verified. The incorporation of Sn is critical for high
substrate temperatures. We will describe how this problem can be circumven
ted. Incorporation of P was only possible in the presence of Sn atoms. (C)
2001 Elsevier Science B.V. All rights reserved.