Cd1-xMgxSe crystals for 0 < x < 0.55 have been grown by the high-pressure B
ridgman method. Bulk chemical analysis of crystals was performed using an e
mission spectrometer. Auger electron spectroscopy (AES) with simultaneous a
rgon ion sputtering has been used to monitor the changes of concentrations
of particular elements in the sub-surface region of the samples. Comparison
of AES and photoluminescence spectra allowed us to make conclusions concer
ning the changes of Cd, Mg and Se concentrations in the uppermost layers of
l:he Cd1-xMgxSe alloys. (C) 2001 Elsevier Science Ltd. All rights reserved
.