Probing solid-solution interfacial chemistry with ATR-IR spectroscopy of particle films

Authors
Citation
Aj. Mcquillan, Probing solid-solution interfacial chemistry with ATR-IR spectroscopy of particle films, ADVAN MATER, 13(12-13), 2001, pp. 1034
Citations number
20
Categorie Soggetti
Multidisciplinary,"Material Science & Engineering
Journal title
ADVANCED MATERIALS
ISSN journal
09359648 → ACNP
Volume
13
Issue
12-13
Year of publication
2001
Database
ISI
SICI code
0935-9648(20010704)13:12-13<1034:PSICWA>2.0.ZU;2-0
Abstract
Infrared (IR) spectroscopy of thin particle films, deposited on an attenuat ed total reflection (ATR) crystal and immersed in solution, has high potent ial for investigating the chemistry of solid-solution interfaces. Phenomena that can be studied include pH-dependent adsorption, photosensitization, p hotocatalysis, and biocompatibility of prosthetic materials. With films a f ew micrometers thick, the penetration depth of the evanescent IR wave is su fficient to monitor surface reactions throughout the high surface area part icle film.