Optical metastability of subband gap (2.2 eV) yellow luminescence in GaN

Citation
Yc. Chang et al., Optical metastability of subband gap (2.2 eV) yellow luminescence in GaN, APPL PHYS L, 79(3), 2001, pp. 281-283
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
79
Issue
3
Year of publication
2001
Pages
281 - 283
Database
ISI
SICI code
0003-6951(20010716)79:3<281:OMOSG(>2.0.ZU;2-U
Abstract
Optical metastability has been studied in undoped GaN films grown on SiC su bstrates having a previously deposited AlN buffer layer. Brief exposures to a higher intensity ultraviolet light resulted in temporary changes in the optical properties of the GaN layer. The photoinduced changes created high contrast patterns on samples that could be observed under an optical micros cope with lower intensity ultraviolet excitation. The subband gap yellow ph otoluminescence peak at 2.2 eV increased significantly after the patterns w ere created. This change slowly returned (hours) to its initial value at ro om temperature. The retention time decreased to a few seconds at temperatur es above 100 degreesC. The data showed that a 1.34 eV thermal activation en ergy exists, which suggests that the cause of these metastable properties i s related to the subband gap yellow luminescence. (C) 2001 American Institu te of Physics.