A simple method is presented in this paper that allows us to verify numeric
ally obtained polarizability tensors of electrically small scatterers by wa
veguide measurements. To this end, a model of the scattering process within
the waveguide is developed. Measurements performed on a small helix in two
different waveguide setups are compared to the theoretical data obtained f
rom the model. A good agreement is demonstrated. Furthermore, the measured
data are highly sensitive to the orientation of the scatterer within the wa
veguide. Thus, the polarizability tensors can be verified.