Numerical investigation of the field and current behavior near lossy edges

Citation
M. Farina et T. Rozzi, Numerical investigation of the field and current behavior near lossy edges, IEEE MICR T, 49(7), 2001, pp. 1355-1358
Citations number
14
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
ISSN journal
00189480 → ACNP
Volume
49
Issue
7
Year of publication
2001
Pages
1355 - 1358
Database
ISI
SICI code
0018-9480(200107)49:7<1355:NIOTFA>2.0.ZU;2-V
Abstract
Real circuits involve metallic edges with finite conductivity and nonideal dielectrics. Usually it is more or less implicitly assumed that fields and induced currents behave as if conductors and dielectrics were ideal. In thi s paper, we show that this assumption is partially erroneous and that the p resence ol real conductors and dielectrics seems to lead to a simpler and m ore physical picture, where longitudinal currents are shown to be nonsingul ar.