Si substrate resistivity design for on-chip matching circuit based on electro-magnetic simulation

Citation
M. Ono et al., Si substrate resistivity design for on-chip matching circuit based on electro-magnetic simulation, IEICE TR EL, E84C(7), 2001, pp. 923-930
Citations number
10
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEICE TRANSACTIONS ON ELECTRONICS
ISSN journal
09168524 → ACNP
Volume
E84C
Issue
7
Year of publication
2001
Pages
923 - 930
Database
ISI
SICI code
0916-8524(200107)E84C:7<923:SSRDFO>2.0.ZU;2-Y
Abstract
For on-chip matching Si-MMIC fabricated on a conventional low resistivity S i substrate, the loss of on-chip inductors is quite high due to the dielect ric loss of the substrate. In order to reduce the loss of on-chip matching circuit, the use of high resistivity Si substrate is quite effective. By us ing electromagnetic simulation, the relationship between coplanar waveguide (CPW) transmission line characteristics and tile resistivity of Si substra te is: discussed. Based on tile simulated results, the resistivity of Si su bstrate is: designed to achieve lower dielectric loss than conductor loss. The effectiveness of high resistivity Si substrate is evaluated by the extr action of equivalent circuit model parameters of the fabricated on-chip spi ral inductors and the measurement of the fabricated on-chip matching Si-MMI C LNA's.