Valence compensated perovskite oxide system Ca1-xLaxTi1-xCrxO3 - Part II -Electrical transport behavior

Citation
Rk. Dwivedi et al., Valence compensated perovskite oxide system Ca1-xLaxTi1-xCrxO3 - Part II -Electrical transport behavior, J MATER SCI, 36(15), 2001, pp. 3649-3655
Citations number
44
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE
ISSN journal
00222461 → ACNP
Volume
36
Issue
15
Year of publication
2001
Pages
3649 - 3655
Database
ISI
SICI code
0022-2461(2001)36:15<3649:VCPOSC>2.0.ZU;2-M
Abstract
Electrical transport behaviour of the valence compensated system Ca1-xLaxTi 1-xCrxO3 (x less than or equal to 0.50) has been investigated by studying t he Seebeck co-efficient, DC and AC conductivity as a function of temperatur e. Seebeck co-efficient, DC conductivity of different compositions has been measured in the temperature range 300 K-1000 K. AC conductivity for differ ent compositions were determined in the temperature range 100-550 K and fre quency range 10 Hz-10 MHz. Positive values of Seebeck co-efficient show tha t holes are the majority charge carriers. Conduction seems to occur by corr elated barrier hopping of holes among Cr3+ and Cr4+ ions or V-o(.) and V-o( ..). Almost equal values of activation energies obtained for DC conductivit y and dielectric relaxation process show that both the processes occur by t he same mechanism. (C) 2001 Kluwer Academic Publishers.