Temperature calibration in dielectric measurements

Citation
Jf. Mano et al., Temperature calibration in dielectric measurements, J THERM ANA, 65(1), 2001, pp. 37-49
Citations number
7
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF THERMAL ANALYSIS AND CALORIMETRY
ISSN journal
13886150 → ACNP
Volume
65
Issue
1
Year of publication
2001
Pages
37 - 49
Database
ISI
SICI code
1388-6150(2001)65:1<37:TCIDM>2.0.ZU;2-Y
Abstract
Dielectric experiments are often performed in non-isothermal conditions. Th us, there is a difference between the temperature of the sample and the sen sor temperature. In this work we propose and compare three temperature cali bration methods based on the detection of transitions or relaxations: i) th e melting of high-purity metallic standards (indium and tin), ii) the 2(nd) order phase transition of a ferroelectric crystal (TGS); iii) the alpha -r elaxation of an amorphous polymer (poly(carbonate)). The results obtained f rom the three different methods were used to construct a calibration curve for a given heating rate.