Citation
Xl. Tan et al., In situ transmission electron microscopy observations of electric-field-induced domain switching and microcracking in ferroelectric ceramics, MAT SCI E A, 314(1-2), 2001, pp. 157-161
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
ISSN journal
09215093
→ ACNP
Volume
314
Issue
1-2
Year of publication
2001
Pages
157 - 161
Database
ISI
SICI code
0921-5093(20010915)314:1-2<157:ISTEMO>2.0.ZU;2-0
Abstract
In situ transmission electron microscopy (TEM) technique was developed to e
xamine micromechanisms of the electric fatigue in ferroelectric ceramics. T
he technique was based on a specially designed specimen connected to a modi
fied TEM heating stage. With this technique, domain switching and nanodomai
n alignment near crack-like flaws were observed under cyclic electric field
s. Following repeated electric cycles. microcracks were found to develop al
ong domain and grain boundaries. (C) 2001 Elsevier Science B,V. All rights
reserved.