Optical response of the graded-gap AlxGa1-xAs X-ray detector

Authors
Pozela, K Pozela, J Dapkus, L Jasutis, V Silenas, A Smith, KM Bendorius, RA
Citation
K. Pozela et al., Optical response of the graded-gap AlxGa1-xAs X-ray detector, NUCL INST A, 466(1), 2001, pp. 58-62
Citations number
4
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
466
Issue
1
Year of publication
2001
Pages
58 - 62
Database
ISI
SICI code
0168-9002(20010621)466:1<58:OROTGA>2.0.ZU;2-H
Abstract
It has been observed that only a part of the AlxGa1-xAs graded-gap layer wi th the energy gap gradient g > 20 eV/cm is active as a X-ray luminescence s ource. The thickness of the active layer is 30-50 mum. To increase the dete ctors optical response efficiency, the following methods are proposed and t ested: 1. Reflection of the X-ray luminescence light, generated in the bulk AlxGa1 -xAs layer, inside the total reflection angle theta; 2. Optical stimulation of the electron-hole radiative recombination. (C) 20 01 Elsevier Science B.V. All rights reserved.