Photoluminescence (PL) from the Si ion-irradiated SiO2/Si/SiO2 layers on Si
substrate at room temperature has been studied to elucidate the origins of
the blue and red luminescence. A luminescence band around 450 nm was obser
ved from as-irradiated sample, which was found to be originated from the di
amagnetic defect known as Bz band generated by Si ion irradiation. The inte
nsity of this band increases with the increase of annealing temperatures up
to a critical temperature. After annealing at 1100 degreesC, the defect-re
lated PL peaks around 450 and 600 nm disappear and a new PL peak appears ar
ound 700 nm. This luminescence band is attributed to similar to5 nm-sized S
i nanocrystals formed along the Si layer between SiO2 layers. (C) 2001 Else
vier Science B.V. All rights reserved.