Facet temperature mapping of GaAs/AlGaAs quantum cascade lasers by photoluminescence microprobe

Citation
V. Spagnolo et al., Facet temperature mapping of GaAs/AlGaAs quantum cascade lasers by photoluminescence microprobe, OPT MATER, 17(1-2), 2001, pp. 219-222
Citations number
5
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
OPTICAL MATERIALS
ISSN journal
09253467 → ACNP
Volume
17
Issue
1-2
Year of publication
2001
Pages
219 - 222
Database
ISI
SICI code
0925-3467(200106/07)17:1-2<219:FTMOGQ>2.0.ZU;2-S
Abstract
The measurement of thermal resistance and facet temperature profile of oper ating GaAs/AlGaAs quantum cascade lasers (QCLs) as a function of injected c urrent, repetition rate and pulse width is reported. The use of microprobe band-to-band photoluminescence (PL) spectroscopy allows to achieve a spatia l resolution <1 mum. Substrate-side and epilayer-side mounted devices with identical laser structures were investigated. At T = 80 K, the thermal resi stance of epilayer-side mounted devices (7.8 K/W) is similar to 30% lower t han that of substrate-side mounted devices, thus explaining the better perf ormance of the former. The outcome of a two-dimensional model of heat propa gation in our structures is compared with the experimental data. (C) 2001 E lsevier Science B.V. All rights reserved.