Raman study of ZnxBe1-xSe solid solutions

Citation
O. Pages et al., Raman study of ZnxBe1-xSe solid solutions, OPT MATER, 17(1-2), 2001, pp. 323-326
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
OPTICAL MATERIALS
ISSN journal
09253467 → ACNP
Volume
17
Issue
1-2
Year of publication
2001
Pages
323 - 326
Database
ISI
SICI code
0925-3467(200106/07)17:1-2<323:RSOZSS>2.0.ZU;2-5
Abstract
Raman spectroscopy is used to identify the LO phonons of ZnxBe1-xSe/GaAs sy stems in a wide composition range. On the layer side a two-mode behavior is evidenced. The eigenfrequencies of the BeSe- and ZnSe-like LO modes corres pond to the maxims of Im[-epsilon(omega ,l)(-1)]. Excellent agreement is ob tained with a model based upon the modified random element isodisplacement (MREI) model. On the substrate side the LO mode couples with a plasmon (P) at the near-interface. The resulting LO-P mode is very sensitive to limit c onditions at the junction. Below x similar to 45% strong coupling is observ ed; above x similar to 45% coupling is relaxed, The first behavior appears to be a marker for clean interfaces while the second one goes with the depo sition of a thin highly disordered layer before the nominal ZnxBe1-xSe is g rown up to the surface. (C) 2001 Elsevier Science B.V. All rights reserved.