K. Yoo et Hh. Weitering, Surface conductance near the order-disorder phase transition on Si(100) - art. no. 026802, PHYS REV L, 8702(2), 2001, pp. 6802-NIL_80
The surface conductance of the Si(100)-(2 x 1) surface was measured as a fu
nction of temperature on a fully depleted Si(100)/SiO2/Si substrate. The su
rface-state conductance is surprisingly large and reveals a clear signature
of the c(4 x 2) --> 2 x 1 order-disorder phase transition of buckled Si di
mers on Si(100). Surface scattering increases with decreasing c(4 x 2) orde
r on the surface.