Ultra-high-resolution electron microscopy of carbon nanotube walls - art. no. 016101

The resolution in scanning transmission electron microscopy may be enhanced by taking advantage of the information contained in the nanodiffraction pa tterns recorded for each position of the scanning incident beam. We have de monstrated the first production of ultrahigh resolution, better than 0.1 nm , by this method, in the imaging of an essentially one-dimensional object, the wall of a multiwalled carbon nanotube, using an instrument for which th e resolution for normal imaging is about 0.3 nm.