The structure, composition, and electrical and optical properties of thin t
ellurium-intercalated fullerene films C60Tex are investigated. The samples
of compositions from C60Te0.1 to C60Te6 are prepared by thermal evaporation
. The sample composition and the impurity distribution are controlled by th
e Rutherford backscattering technique. The Raman vibrational spectra indica
te changes in the symmetry of a C-60 molecule: the strain of the molecule i
ncreases with a decrease in the tellurium concentration and decreases as th
e tellurium impurity concentration increases. The evolution of the optical
absorption spectra and the electrical conductivity suggests that intercalat
ion of a tellurium impurity leads to modification of the electronic structu
re of the material. This process is accompanied by a shift and change in sh
ape of the optical absorption edge and a change in the electrical conductiv
ity of films by several orders of magnitude depending on the composition. T
he electrical conductivity is minimum at a low tellurium impurity content.
(C) 2001 MAIK "Nauka/Interperiodica".