Buried CdTe/CdMgTe single quantum dots using selective thermal interdiffusion

Citation
S. Zaitsev et al., Buried CdTe/CdMgTe single quantum dots using selective thermal interdiffusion, SEMIC SCI T, 16(7), 2001, pp. 631-634
Citations number
26
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
ISSN journal
02681242 → ACNP
Volume
16
Issue
7
Year of publication
2001
Pages
631 - 634
Database
ISI
SICI code
0268-1242(200107)16:7<631:BCSQDU>2.0.ZU;2-T
Abstract
Individual buried CdTe/CdMgTe quantum dots (QDs) with diameters down to 140 nm have been realized using a novel technique of selective intermixing. Si O2 masks are defined by high-resolution electron beam lithography and a sub sequent annealing step causes a lateral selective interdiffusion between Cd and Mg atoms beneath the SiO2 masks. This results in a lateral modulation of the bandgap with a confinement potential of up to 270 meV, Photoluminesc ence studies of single QDs confirm the quasi-three-dimensional confinement of excitons, which is evidenced by a pronounced linewidth narrowing, the fo rmation of biexcitons and the observation of excited state emission.