Properties of CuxS thin film based structures: influence on the sensitivity to ammonia at room temperatures

Authors
Setkus, A Galdikas, A Mironas, A Simkiene, I Ancutiene, I Janickis, V Kaciulis, S Mattogno, G Ingo, GM
Citation
A. Setkus et al., Properties of CuxS thin film based structures: influence on the sensitivity to ammonia at room temperatures, THIN SOL FI, 391(2), 2001, pp. 275-281
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
391
Issue
2
Year of publication
2001
Pages
275 - 281
Database
ISI
SICI code
0040-6090(20010716)391:2<275:POCTFB>2.0.ZU;2-8
Abstract
Surface and electrical properties of thin CuxS films grown on different sub strates (polyethylene and micro-porous-Si layer) sensitive to ammonia at ro om temperature are investigated. The resistance response to ammonia is meas ured in the CuxS in air with relative humidity from 15 to 100% at temperatu res from 290 to 350 K. The surface chemical composition and the morphology are analysed. A honeycombed construction of the CuxS films deposited on a m icro-porous Si-layer and proportions between components in the chemical com position are found to correlate with the higher sensitivity to ammonia in a ir at room temperature. (C) 2001 Elsevier Science B.V. All rights reserved.