Electron back scatter diffraction and synchrotron X-ray peak profile analysis as tools for microstructural characterization of large strain work hardened metals

By the example of large strain cold worked AZ, two new methods (electron ba ck scatter diffraction and synchrotron X-ray peak profile analysis) are int roduced which are well capable to monitor the characteristics of the deform ation structure on a microstructural level. While the first method has been proved to properly describe the sizes of newly forming subgrains and their misorientations, the second one allows for measuring the local densities o f dislocations, their arrangements and the local long range internal stress es. The results show that during large strain cold working new high angle g rain boundaries are formed which exhibit markedly higher local dislocation densities and a much lower level of local internal stresses compared with t hose of the original dislocation cell walls from which they appear to devel op.