Verification and comparison of a fast Fourier transform-based full diffraction method for tilted and offset planes

Citation
N. Delen et B. Hooker, Verification and comparison of a fast Fourier transform-based full diffraction method for tilted and offset planes, APPL OPTICS, 40(21), 2001, pp. 3525-3531
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
40
Issue
21
Year of publication
2001
Pages
3525 - 3531
Database
ISI
SICI code
0003-6935(20010720)40:21<3525:VACOAF>2.0.ZU;2-2
Abstract
The recent introduction of a fast Fourier transform- (FFT-) based method fo r calculating the Rayleigh-Sommerfeld full diffraction integral for tilted and offset planes permits high-speed evaluation of integrated optical syste ms. An important part of introducing a new calculational tool is its valida tion and an assessment of its limitations. The validity of the new FFT-base d method was determined by comparison of that method with direct integratio n (DI) of the Rayleigh-Sommerfeld integral, a well-established method. Poin ts of comparison were accuracy, computational speed, memory requirements of the host computer, and applicability to various optical modeling situation s. The new FFT-based method is 228 times faster, yet requires 14 times more memory, than the DI method for a 500 mum by 500 mum real computational win dow. (C) 2001 Optical Society of America.