Characteristic-impedance measurement error on lossy substrates

Authors
Williams, DF Arz, U Grabinski, H
Citation
Df. Williams et al., Characteristic-impedance measurement error on lossy substrates, IEEE MICR W, 11(7), 2001, pp. 299-301
Citations number
13
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS
ISSN journal
15311309 → ACNP
Volume
11
Issue
7
Year of publication
2001
Pages
299 - 301
Database
ISI
SICI code
1531-1309(200107)11:7<299:CMEOLS>2.0.ZU;2-H
Abstract
This paper examines error caused by parasitic inductance in the characteris tic impedance measured by the calibration comparison method on lossy silico n substrates.