Testing schemes for FIR filter structures

This paper presents a new pseudoexhaustive test methodology for digital fin ite impulse response (FIR) filters. The proposed scheme can be employed to detect any combinational faults within the basic cell of the functional uni ts occurring in linear phase comb filters, trees of sign-extended adders an d phase-shift multipliers. It uses additive generators as a source of pseud oexhaustive patterns to systematically test all FIR filter building blocks.