M. Varela et al., High-resolution and energy-filtered transmission electron microscopy of YBa2Cu3O7-x/PrBa2Cu3O7 superlattices, J ALLOY COM, 323, 2001, pp. 558-561
Structural disorder induced by epitaxial strain relaxation in c-axis orient
ed [YBa2Cu3O7-x n u,c/PrBa2Cu3O7 5 u,c] superlattices on (100) SrTiO3 subst
rates has been analyzed by high-resolution and energy-filtered transmission
electron microscopy. Epitaxial strain shows up in ultrathin YBCO layers wi
th thickness below 4 unit cells. Strain relaxation takes place when layer t
hickness increases above this value. Microscopy observations for epitaxiall
y strained superlattices show a good morphology of the layers, with sharp a
nd flat interfaces. However, in relaxed samples rougher interfaces are obse
rved, together with microdomains showing the c-axis parallel to the substra
te plane which preserve the superlattice compositional profile. Such microd
omains of c-parallel growth provide a path for reduced lattice mismatch, co
nforming a very efficient mechanism for strain relaxation. (C) 2001 Elsevie
r Science B.V. All rights reserved.