Interface formation in the Gd/HOPG and Dy/HOPG systems - Electron spectroscopy studies

Citation
Si. Bozhko et al., Interface formation in the Gd/HOPG and Dy/HOPG systems - Electron spectroscopy studies, J ALLOY COM, 323, 2001, pp. 701-706
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF ALLOYS AND COMPOUNDS
ISSN journal
09258388 → ACNP
Volume
323
Year of publication
2001
Pages
701 - 706
Database
ISI
SICI code
0925-8388(20010712)323:<701:IFITGA>2.0.ZU;2-I
Abstract
The electronic and atomic structures of the interfaces formed upon depositi on of Gd and Dy onto HOPG(0001) at substrate temperatures of 20 and 300 K h ave been studied by AES, UPS, XPS, EELS, and LEED. At both temperatures stu died, Gd/HOPG interface reproduces atomic structure of HOPG(0001) up to 20 Angstrom thicknesses. The analysis performed by AES favors a quasi layer-by -layer growth and diffusion of Gd and Dy into interplane space of graphite even at 20 and 300 K. The structure of Dy/HOPG interface is different from that of the Gd/HOPG system: at thick coverages (45 Angstrom) when only Dy f eatures an observed by electron spectroscopy, the LEED pattern typical of c lean HOPG(0001) coexists with superstructural rings. Annealing of the inter faces at temperatures up to 1300 K induces, most probably, formation of the ordered carbide-like systems with geometrical structure analogous to that of pristine graphite for Gd-C and superstructure of root3 x root3 type for Dy-C systems. (C) 2001 Elsevier Science BN. All rights reserved.