Ak. Sikder et al., Interesting trends in direct current electrical conductivity of chemical vapor deposited diamond sheets, J APPL PHYS, 90(3), 2001, pp. 1642-1649
Self-supported diamond sheets of the thickness ranging from 15 to 30 mum we
re prepared using hot filament chemical vapor deposition technique. The con
trolled variation of the deposition parameters resulted in the sheets with
varying amount of nondiamond impurities. Routine characterization of the sh
eets was carried out using scanning electron microscopy, x-ray diffractomet
ry, Raman spectroscopy, Fourier transform infrared spectroscopy, and Positr
on annihilation spectroscopy techniques. Detailed measurements of room temp
erature electrical conductivity (sigma (300)), current-voltage (I-V) charac
teristics, and annealing studies on the sheets deposited with various struc
tural disorder have yielded useful information about the electrical conduct
ion in this interesting material. sigma (300) and I-V characteristic measur
ements were done in sandwiched configuration taking care off the surface ef
fects. The diamond sheets deposited at low deposition pressure (P-d< 60 Tor
r) contain negligible nondiamond impurities and show sigma (300)congruent t
o 10(-6)-10(-7) S.cm(-1). The I-V characteristics in these sheets show spac
e charge limited conduction behavior with I proportional toV(n) and n >1, i
n high voltage range. In contrast the sheets deposited at higher pressure (
60 Torr and higher), containing high concentration of nondiamond impurities
, show a sharp reduction in the values of sigma (300). Interestingly, the c
onduction in these sheets is ohmic with n values nearly equal to unity. Sim
ilarly the sheets deposited with nitrogen also show a sharp reduction in si
gma (300). Annealing of all types of diamond sheets results in a decrease i
n sigma (300) values by several orders of magnitude. In the sheets deposite
d at low P-d, the n values increase sharply with annealing. On the other ha
nd the values of n in the sheets deposited at higher pressure remain consta
nt with annealing. The above results are explained in terms of hydrogen abs
traction from the traps and compensation of donor-acceptor pairs. (C) 2001
American Institute of Physics.