Ellipsometric study of anodic oxide films on alloys of the Ti-Al system

Authors
Kamkin, AN Fishgoit, LA Bukhan'ko, NG Portnov, VI Safonov, VA
Citation
An. Kamkin et al., Ellipsometric study of anodic oxide films on alloys of the Ti-Al system, RUSS J ELEC, 37(11), 2001, pp. 1140-1148
Citations number
24
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
RUSSIAN JOURNAL OF ELECTROCHEMISTRY
ISSN journal
10231935 → ACNP
Volume
37
Issue
11
Year of publication
2001
Pages
1140 - 1148
Database
ISI
SICI code
1023-1935(200111)37:11<1140:ESOAOF>2.0.ZU;2-I
Abstract
Anodic oxide films (AOF) on neat titanium and on alloys of the Ti-Al system (Ti-10 at. % Al, Ti-24 at. % Al, Ti-50 at. % Al, Ti-75 at. % Al) formed in borate buffer solution are studied by ellipsometry. A model is proposed, w hich adequately describes the shape of the alloy surface with and without A OF The model takes into account the roughness factor, allowing one to more correctly determine optical parameters of AOF and dependence of its thickne ss on anodic potential. It is found that the alloy surface roughness is eff ectively smoothed with increasing applied potential.