Nanotribology studies of Cr, Cr2N and CrN thin films using constant and ramped load nanoscratch techniques

Citation
G. Wei et al., Nanotribology studies of Cr, Cr2N and CrN thin films using constant and ramped load nanoscratch techniques, SURF COAT, 146, 2001, pp. 357-362
Citations number
18
Categorie Soggetti
Material Science & Engineering
Journal title
SURFACE & COATINGS TECHNOLOGY
ISSN journal
02578972 → ACNP
Volume
146
Year of publication
2001
Pages
357 - 362
Database
ISI
SICI code
0257-8972(200109/10)146:<357:NSOCCA>2.0.ZU;2-E
Abstract
The nanotribological behavior of DC magnetron sputtered Cr, Cr2N and CrN th in films has been studied using nanoscratch techniques. Constant and ramped load (5 mN) scratches were made using a Nano Indenter II system on 500-nm- thick Cr, Cr2N and CrN thin films. Ramped-load scratch studies have been ca rried out an 10-nm-thick Cr, Cr2N and CrN. Wear tracks were imaged by atomi c force microscopy. The dependence of the displacement, residual wear depth , percent elastic recovery, and friction coefficient on load is compared in constant load and ramped load tests. Under the same (maximum) load, consta nt load tests exhibit higher displacements, residual depths and friction co efficients, but lower percent elastic recoveries. The chromium nitride film s (Cr2N and CrN) show less permanent damage, lower coefficients of friction and higher percent elastic recovery than pure chromium under the same (max imum) load. However, the adhesive strength of Cr2N needs to be improved. (C ) 2001 Elsevier Science B.V. All rights reserved.