The growth morphology and thr chemical interactions of thin In layers
on an H-terminated Si(lll)1 x 1 surface, prepared by a wet chemical pr
ocedure, have been investigated by scanning tunneling microscopy (STM)
and synchrotron radiation based photoemission. The interactions betwe
en the In overlayer and the H-Si(1 x 1) surface are weak as evidenced
by valence band and core level photoemission spectra. As on the clean
Si(111)7 x 7 surface an island growth mode of In is observed on the H-
Si(1 x 1) surface, but the island structures display significant diffe
rences in shape and growth behaviour between the two surfaces, indicat
ing a modified In growth kinetics mediated by the H adlayer. This surf
actant-type role of H is discussed. Annealing of the room temperature
deposited In layers results in remarkable coverage-dependent morpholog
y changes which signal the predominance of kinetic effects in the room
temperature growth. For higher In coverages (> 25 monolayers) well-or
dered single crystalline In islands are formed at room temperature as
indicated by atomically resolved STM images and angle resolved photoem
ission measurements. (C) 1997 Elsevier Science B.V.