Analysis of fiber probes of scanning near-field optical microscope by field emission microscopy

Authors
Sekatskii, SK Mironov, BN Lapshin, DA Dietler, G Letokhov, VS
Citation
Sk. Sekatskii et al., Analysis of fiber probes of scanning near-field optical microscope by field emission microscopy, ULTRAMICROS, 89(1-3), 2001, pp. 83-87
Citations number
14
Categorie Soggetti
Multidisciplinary,"Spectroscopy /Instrumentation/Analytical Sciences
Journal title
ULTRAMICROSCOPY
ISSN journal
03043991 → ACNP
Volume
89
Issue
1-3
Year of publication
2001
Pages
83 - 87
Database
ISI
SICI code
0304-3991(200110)89:1-3<83:AOFPOS>2.0.ZU;2-L
Abstract
It is shown that field emission microscopy and related methods can be used to analyze the metal coated fiber tips, which nowadays are the most frequen tly used sensor for the scanning near-field optical microscopy (SNOM). Meta l free and thus non field-emitting aperture for the light transmission on t he tip apex can be directly seen and its parameters can be measured, which is very important for the interpretation of SNOM data. (C) 2001 Elsevier Sc ience B.V. All rights reserved.