CROSS-SECTION FOR PHOTODETACHMENT OF THE EXCITED C-(D-2) ION USING FAST ION-LASER-BEAM ELECTRON-SPECTROSCOPY

Authors
LEE DH BRANDON WD PEGG DJ HANSTORP D
Citation
Dh. Lee et al., CROSS-SECTION FOR PHOTODETACHMENT OF THE EXCITED C-(D-2) ION USING FAST ION-LASER-BEAM ELECTRON-SPECTROSCOPY, Physical review. A, 56(2), 1997, pp. 1346-1350
Citations number
13
Categorie Soggetti
Physics
Journal title
Physical review. A → ACNP
ISSN journal
10502947
Volume
56
Issue
2
Year of publication
1997
Pages
1346 - 1350
Database
ISI
SICI code
1050-2947(1997)56:2<1346:CFPOTE>2.0.ZU;2-0
Abstract
A crossed-beam apparatus incorporating photoelectron spectroscopy has been used to determine the partial cross section for photodetaching an electron from the excited C-(D-2) ion via the (3)Pks,d channels. The measurement, which was based on the saturation of the photodetachment process, was normalized to that of D- taken under the same experimenta l conditions. At a photon energy of 2.076 eV, the cross section was fo und to be 13(2) Mb. Simultaneously, the beam fraction in the excited s tate in the incoming C- ion beam was found to be 0.5(1).