NEW APPROACHES FOR NEUTRON DEPTH PROFILING

Citation
Ea. Schweikert et Jf. Welsh, NEW APPROACHES FOR NEUTRON DEPTH PROFILING, Journal of radioanalytical and nuclear chemistry, 180(2), 1994, pp. 255-262
Citations number
9
Categorie Soggetti
Chemistry Analytical","Nuclear Sciences & Tecnology","Chemistry Inorganic & Nuclear
ISSN journal
02365731
Volume
180
Issue
2
Year of publication
1994
Pages
255 - 262
Database
ISI
SICI code
0236-5731(1994)180:2<255:NAFNDP>2.0.ZU;2-Y
Abstract
The scope of NDP can be expanded by measuring (via time-of-flight) the kinetic energies of the recoils emitted from (n,p) or (n,alpha) react ions. When they occur inside a solid, the energies of the emerging rec oils reveal depth from which they originated. The Recoil Nucleus Time- of-Flight NDP (RN-TOF-NDP) technique can reveal the depth distribution of some isotopes (e.g., B-10, Bi-210) with a resolution of a few angs trom. Furthermore, it is possible to detect atomic and molecular speci es ejected at the surface site where the recoil emerges from the solid . This paper discusses the methodology for RN-TOF-NDP and its applicat ions including surface analysis based on atomic and molecular ions cod esorbed with the recoils.