Bayesian Analysis of the Weibull Failure Model Under Stochastic Variation of the Shape and Scale Parameters

Authors
Tsokos, Chris P. Rao, A.N.V.
Citation
Chris P. Tsokos et A.N.V. Rao, Bayesian Analysis of the Weibull Failure Model Under Stochastic Variation of the Shape and Scale Parameters, Metron, (3/4), 1976, pp. 201
Journal title
Metron
ISSN journal
00261424 → ACNP
Issue
3/4
Year of publication
1976
Database
ESSPER
SICI code
0026-1424(1976)61:3/4<201:BAOTWF>2.0.ZU;2-G