ENERGY-LOSS SPECTROSCOPY OF RUO2 THIN-FILMS

The dielectric constant and the reflectivity spectrum of polycrystalli ne RuO2 films, grown by pulsed laser deposition, are presented as dedu ced by optical reflection and electron energy-loss spectroscopy. The s imilarities of these spectra with those obtained on single crystals, s uggest that the production of RuO2 by laser ablation is a very good to ol in obtaining films with electronic and structural characteristics e quivalent to those of the bulk material. (C) 1997 American Institute o f Physics.