MULTIPLE-SCATTERING EXAFS AND EXELFS STUDY OF AL3TI AND TI3AL ALLOYS

Authors
SIKORA T HUG G JAOUEN M REHR JJ
Citation
T. Sikora et al., MULTIPLE-SCATTERING EXAFS AND EXELFS STUDY OF AL3TI AND TI3AL ALLOYS, Journal de physique. IV, 7(C2), 1997, pp. 231-232
Citations number
5
Categorie Soggetti
Physics
Journal title
Journal de physique. IV → ACNP
ISSN journal
11554339
Volume
7
Issue
C2
Year of publication
1997
Part
1
Pages
231 - 232
Database
ISI
SICI code
1155-4339(1997)7:C2<231:MEAESO>2.0.ZU;2-V
Abstract
Extended X-ray absorption Fine Structure (EXAFS) and Extended Energy L oss Fine Structure (EXAFS) spectroscopies have been used to study the local atomic order of Al3Ti and Ti3Al. Using the multiple scattering c ode FEFF6, we will show that now EXAFS can be considered as a probe fo r medium range order studies. The limitations of this new way of using EXAFS are briefly discussed.