IN-SITU MCD MAGNETOMETRY IN THE ULTRATHIN LIMIT - FE ON CU(100)

Citation
Jh. Dunn et al., IN-SITU MCD MAGNETOMETRY IN THE ULTRATHIN LIMIT - FE ON CU(100), Journal de physique. IV, 7(C2), 1997, pp. 383-387
Citations number
28
Categorie Soggetti
Physics
Journal title
ISSN journal
11554339
Volume
7
Issue
C2
Year of publication
1997
Part
1
Pages
383 - 387
Database
ISI
SICI code
1155-4339(1997)7:C2<383:IMMITU>2.0.ZU;2-O
Abstract
By means of Magnetic Circular Dichroism in X-ray Absorption Spectrosco py we investigated the magnetic properties of fct Fe films stabilised by epitaxial growth on the Cu(100) surface. These are compared to bcc like Fe films. The films were characterised in situ by means of LEED, AES and XAS for order and cleanness. Low temperature (approximate to 5 0 K) and angle dependent measurements are reported for thicknesses aro und 3.5 (fct(5 x 1) phase) and 20 (bcc phase) monolayers. A much stron ger MCD response is obtained from the thinner films (perpendicular mag netisation). The MCD sum rules enabled us to determine the orbital and spin contributions to the magnetic moment for the two phases. The res ults are compared to theory.