ALUMINUM K-EDGE XAFS OF GIBBSITE AND RELATED-COMPOUNDS

Citation
Kr. Bauchspiess et al., ALUMINUM K-EDGE XAFS OF GIBBSITE AND RELATED-COMPOUNDS, Journal de physique. IV, 7(C2), 1997, pp. 485-487
Citations number
7
Categorie Soggetti
Physics
Journal title
ISSN journal
11554339
Volume
7
Issue
C2
Year of publication
1997
Part
1
Pages
485 - 487
Database
ISI
SICI code
1155-4339(1997)7:C2<485:AKXOGA>2.0.ZU;2-5
Abstract
X-ray absorption spectra have been measured in total-electron yield mo de at the aluminum K edge in gibbsite and related compounds. The exper iments were carried out at the UVSOR storage ring in Okazaki, Japan, w hich is particularly suitable for these measurements because of its re latively low intensity which permits the use of a quartz monochromator without causing radiation damage to the quartz. It is shown that XAFS spectra of good quality can be obtained.