XPS STUDIES OF SINGLE-CRYSTALS OF BI-2212, TL-2212 AND TL-2223

Citation
Br. Sekhar et al., XPS STUDIES OF SINGLE-CRYSTALS OF BI-2212, TL-2212 AND TL-2223, Journal de physique. IV, 7(C2), 1997, pp. 581-582
Citations number
6
Categorie Soggetti
Physics
Journal title
ISSN journal
11554339
Volume
7
Issue
C2
Year of publication
1997
Part
1
Pages
581 - 582
Database
ISI
SICI code
1155-4339(1997)7:C2<581:XSOSOB>2.0.ZU;2-L
Abstract
High quality single crystals of Bi-2212, Tl-2212 and Tl-2223 were stud ied using X-ray photoelectron spectroscopy. From a deconvolution of th e Cu2p(3/2) main line, we have shown that the density of O 2p holes in the Cu-O planes are qualitatively similar in case of the Bi and Tl-22 12 systems even though they have shown many other differences in their electronic structure properties. Also the results show a dependence o f the density of holes on the number of Cu-O planes as we go from Tl-2 212 to Tl-2223.