PROBING THE MICROSTRUCTURE IN SEMICONDUCTOR LAYER MATERIALS USING SYNCHROTRON-RADIATION

Advances in modern electronics and photonics depend crucially on techn ical capabilities to control the size, composition, and morphology of semiconductor layer structures. To exploit this important class of mat erials such as quantum wells and superlattices for technological appli cations, physical understanding of microscopic structures on the nanom eter scale is needed.