Ds. Chuu et Cm. Lin, RAMAN-SPECTROSCOPY AND THE PRESSURE EFFECT OF THE DILUTED MAGNETIC SEMICONDUCTORS ZN1-XMNXSE, Zhongguo wuli xuekan, 35(4), 1997, pp. 509-516
The Raman spectroscopy of Zn1-xMnxSe thin films with Mn concentration
x = 0.04, 0.19 and 0.32 and high pressure induced phase transition of
Zn0.76Mn0.24Se crystal are investigated. The energy-dispersive x-ray d
iffraction (EDXD) is used to study the pressure induced phase transiti
on. It is found the zone-center optical phonons of Zn1-xMnxSe thin fil
ms exhibit an intermediate mode behaviour. For Zn0.76Mn0.24Se crystal,
three Raman modes: one TO mode at 197.2 cm(-1), one LO mode at 249.4
cm(-1), and a Mn local mode located at 222.5 cm(-1) are found at ambie
nt pressure. The Mn local mode splits into two modes at 4.7 GPa while
visible anomaly splittings of TO mode occur at 6.0 and 8.9 GPa. The se
miconductor-metal phase transition of Zn0.76Mn0.24Se crystal is observ
ed at 9.6GPa which is 4.8 GPa lower than that of ZnSe crystal. The red
uction of the phase transition pressure is ascribed to the increasing
of the volume factor of the impurity atom.