X-RAY ASYMPTOTIC BRAGG-DIFFRACTION - STUDY OF INTERFACES BETWEEN HG1-XCDXTE CRYSTALS AND FILMS

Authors
CHAPLANOV V NEFEDOV A SHIPOV I YAKIMOV S
Citation
V. Chaplanov et al., X-RAY ASYMPTOTIC BRAGG-DIFFRACTION - STUDY OF INTERFACES BETWEEN HG1-XCDXTE CRYSTALS AND FILMS, Physica. B, Condensed matter, 198(1-3), 1994, pp. 7-8
Citations number
7
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physica. B, Condensed matter → ACNP
ISSN journal
09214526
Volume
198
Issue
1-3
Year of publication
1994
Pages
7 - 8
Database
ISI
SICI code
0921-4526(1994)198:1-3<7:XAB-SO>2.0.ZU;2-D
Abstract
Interfaces between Hg1-xCdxTe crystals and oxide films have been inves tigated by X-ray asymptotic Bragg diffraction. The parameters which ch aracterize this interface on the crystal polar faces (1 1 1) have been found. The effect of the crystal electric field on the ion transport in the subsurface region is discussed.