Nk. Pleshanov et al., ON THE USE OF SPECULAR NEUTRON REFLECTION IN THE STUDY OF ROUGHNESS AND INTERDIFFUSION IN THIN-FILM STRUCTURES, Physica. B, Condensed matter, 198(1-3), 1994, pp. 27-32
Some new possibilities of using specular neutron reflection in the stu
dy of roughness and interdiffusion in thin-film structures have been p
roposed and tested (the use of polychromators and supermirrors, direct
measurement of the thickness of nonmagnetic interdiffusion layers). A
statistical roughness growth law was found to be satisfactory in the
interpretation of results, the growth rate being dependent on the mate
rials used, film deposition techniques, etc. The use of (lambda/4, lam
bda/2)-sequences is proposed to increase the sensitivity of the method
to the nonmagnetic interdiffusion layer thickness.