ON THE USE OF SPECULAR NEUTRON REFLECTION IN THE STUDY OF ROUGHNESS AND INTERDIFFUSION IN THIN-FILM STRUCTURES

Citation
Nk. Pleshanov et al., ON THE USE OF SPECULAR NEUTRON REFLECTION IN THE STUDY OF ROUGHNESS AND INTERDIFFUSION IN THIN-FILM STRUCTURES, Physica. B, Condensed matter, 198(1-3), 1994, pp. 27-32
Citations number
5
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
09214526
Volume
198
Issue
1-3
Year of publication
1994
Pages
27 - 32
Database
ISI
SICI code
0921-4526(1994)198:1-3<27:OTUOSN>2.0.ZU;2-P
Abstract
Some new possibilities of using specular neutron reflection in the stu dy of roughness and interdiffusion in thin-film structures have been p roposed and tested (the use of polychromators and supermirrors, direct measurement of the thickness of nonmagnetic interdiffusion layers). A statistical roughness growth law was found to be satisfactory in the interpretation of results, the growth rate being dependent on the mate rials used, film deposition techniques, etc. The use of (lambda/4, lam bda/2)-sequences is proposed to increase the sensitivity of the method to the nonmagnetic interdiffusion layer thickness.