X-RAY-DIFFRACTION FROM MESOSCOPIC SYSTEMS

Two activities of our group concerning structures on mesoscopic length scales are presented: (1) CoSi2 layers buried in Si-wafers have been studied with many scattering geometries; the emphasis is on diffuse sc attering from rough interfaces and diffuse scattering from atomic scal e defects. (2) The other example is an investigation of laterally stru ctured surfaces in the region of total external reflection and around Bragg peaks. In both cases extensions of the presently available model s are necessary.