COHERENCE LENGTH DETERMINATION OF X-RAYS WITH LATERALLY STRUCTURED SURFACES

Authors
TOLAN M BAHR D SUSSENBACH J PRESS W BRINKOP F KOTTHAUS JP
Citation
M. Tolan et al., COHERENCE LENGTH DETERMINATION OF X-RAYS WITH LATERALLY STRUCTURED SURFACES, Physica. B, Condensed matter, 198(1-3), 1994, pp. 55-57
Citations number
5
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physica. B, Condensed matter → ACNP
ISSN journal
09214526
Volume
198
Issue
1-3
Year of publication
1994
Pages
55 - 57
Database
ISI
SICI code
0921-4526(1994)198:1-3<55:CLDOXW>2.0.ZU;2-2
Abstract
It is investigated if the spatial extent of the coherently illuminated area of a sample surface is completely defined by the q(x)-resolution of the used diffractometer. For this purpose, X-ray diffraction exper iments with laterally structured GaAs-surfaces have been performed.